Sirohi, R. S. <br/><br/>
Optical methods of measurement :  wholefield techniques / 
Rajpal S. Sirohi. 
 - 2nd ed. 
 - Boca Raton :  CRC Press,  c2009. 
 - xxvi, 290 p. :  ill. ;  25 cm. 
 - Optical science and engineering ;  146 .
<br/><br/>Includes bibliographical references and index. 
<br/><br/>Waves and beams -- Optical interference -- Diffraction -- Phase-evaluation methods -- Detectors and recording materials -- Holographic interferometry -- Speckle metrology -- Photoelasticity -- The Moiré phenomenon. 
<br/><br/><label>ISBN: </label>1574446975 (hardcover : alk. paper) 9781574446975 
<br/><br/><label>LCCN: </label>2009019252 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Optical measurements.
<br/><br/><label>LC Class. No.: </label>QC367  / .S57 2009 
<br/><br/><label>Dewey Class. No.: </label>681.25  / SRO