000 | 11091cam a22003614a 4500 | ||
---|---|---|---|
003 | BUC | ||
005 | 20220404043542.0 | ||
008 | 200120s2001 maua g b 001 0 eng d | ||
010 | _a2001035918 | ||
020 | _a1580531474 | ||
020 | _a9781580531474 | ||
040 |
_aBADR UNIVERSITY IN CAIRO _beng _cBADR UNIVERSITY IN CAIRO _erda |
||
041 | _aeng | ||
050 | 0 | 0 |
_aTK7876 _b.B63 2001 |
082 | 0 | 4 |
_a621.3813 _221 _bBJE |
100 | 1 |
_aBolomey, J. C. _q(Jean-Charles) |
|
245 | 1 | 0 |
_aEngineering applications of the modulated scatterer technique / _cJean-Charles Bolomey, Fred E. Gardiol |
260 |
_aBoston : _bArtech House, _c2001 |
||
300 |
_axxii, 255 pages : _billustrations ; _c24 cm |
||
336 | _a36 | ||
490 | 1 | _aArtech House antennas and propagation library | |
504 | _aIncludes bibliographical references and index. | ||
505 |
_g1.1 _tWhere Near-Field Measurements Are Useful _g1 -- _g1.1.1 _tInformation Provided by Near-Field Maps _g1 -- _g1.1.2 _tNear-Field Diagnostics _g2 -- _g1.1.3 _tMeasurements May Perturb the Near-Fields _g2 -- _g1.1.4 _tModulated Scatterer Approach _g2 -- _g1.1.5 _tBasic Requirement _g3 -- _g1.1.6 _tNear-to-Far-Field Transformations _g3 -- _g1.1.7 _tTwo Sets of Applications of Modulated Scatterers _g3 -- _g1.2 _tNear-Field Basics _g4 -- _g1.2.1 _tSome Definitions for Free-Space Radiation of Antennas _g4 -- _g1.2.2 _tExtension to Small Antennas and Circuits _g5 -- _g1.2.3 _tAbout the Near Field Within Inhomogeneous Structures _g6 -- _g1.2.4 _tRemark _g6 -- _g1.3 _tVarious Kinds of Measurements _g7 -- _g1.3.1 _tStandard Circuit Measurements _g7 -- _g1.3.2 _tStandard Antenna Measurements _g7 -- _g1.3.3 _tDirect Near-Field Measurement _g8 -- _g1.3.4 _tPerturbation Techniques for Indirect Measurements _g9 -- _g1.3.5 _tCavity Perturbation _g9 -- _g1.3.6 _tPerturbation Measurement of SAR in Phantoms _g10 -- _g1.3.7 _tPerturbation by a Scatterer _g10 -- _g1.3.8 _tMeasurement of the Far-Field Pattern of an Antenna _g11 -- _g1.4 _tModulated Scatterer Technique _g11 -- _g1.4.1 _tSpinning Dipole _g11 -- _g1.4.2 _tElectrically Modulated Scatterer _g11 -- _g1.4.3 _tHistorical Landmarks _g12 -- _g1.4.4 _tComparison of Direct and Indirect Measurements _g13 -- _g1.4.5 _tTagging Systems and Transponders _g13 -- _g1.4.6 _tBiologically Modulated Scatterers _g15 -- _g1.5 _tAbout Computer Simulation And Measurement _g17 -- _g1.6 _tField Maps _g18 -- _g1.6.1 _tMicrostrip Directional Coupler _g18 -- _g1.6.2 _tPrinted Patch Antenna _g20 -- _g1.6.3 _tMeasurements of Large Antennas _g22 -- _g1.6.4 _tEMC _g24 -- _g1.6.5 _tDosimetry _g25 -- _g1.6.6 _tMicrowave Tomography _g27 -- _gChapter 2 _tBasic Scatterer Electromagnetics -- _g2.1.1 _tEffects Produced by a Field on a Probe _g35 -- _g2.1.2 _tProbe Characteristics in the Receiving Mode _g36 -- _g2.1.3 _tProbe Characteristics in the Scattering Mode _g36 -- _g2.1.4 _tBistatic Operation _g37 -- _g2.1.5 _tMonostatic Operation _g38 -- _g2.1.6 _tDefinition of the Nominal Environment _g38 -- _g2.1.7 _tRadar Analogy _g39 -- _g2.1.8 _tPower Considerations _g40 -- _g2.1.9 _tComparison of Monostatic and Bistatic Operations _g40 -- _g2.1.10 _tPractical Considerations _g40 -- _g2.2 _tPrinciple Of Modulated Scattering _g41 -- _g2.2.1 _tModulated Scatterers _g41 -- _g2.2.2 _tMechanically Modulated Scatterers _g42 -- _g2.2.3 _tElectrically Modulated Scatterers _g43 -- _g2.2.4 _tOptically Modulated Scatterers _g44 -- _g2.2.5 _tLight Beam on Photosensitive Material _g45 -- _g2.2.6 _tComparison of the Modulation Schemes _g46 -- _g2.2.7 _tProperties of the MST _g46 -- _g2.3 _tEquivalent Multiport Representation _g47 -- _g2.3.1 _tEquivalent Linear Black Box _g47 -- _g2.3.2 _t"Good" and "Bad" Obstacles _g48 -- _g2.3.3 _tMatrix Formulations _g49 -- _g2.3.4 _tImpedance Matrix _g49 -- _g2.3.5 _tAdmittance Matrix _g50 -- _g2.3.6 _tRelationships Between [Z] and [Y] Matrices _g50 -- _g2.4 _tScattering Matrix Formulation _g51 -- _g2.4.1 _tComplex Normalized Waves _g51 -- _g2.4.2 _tScattering Matrix of an N-Port Device _g52 -- _g2.4.3 _tTranslation of the Reference Planes _g52 -- _g2.4.4 _tRelationships Between Matrices _g53 -- _g2.4.5 _tRemark _g54 -- _g2.4.6 _tScattering Matrix for the Monostatic Setup (N = 2) _g54 -- _g2.4.7 _tScattering Matrix for the Bistatic Setup (N = 3) _g56 -- _g2.4.8 _tExtension to Configurations for Which N> 3 _g57 -- _g2.4.9 _tRemark About Matrix Formulations _g58 -- _gChapter 3 _tModulated Scattering Probes -- _g3.1 _tProbe Response In Various Situations _g61 -- _g3.1.1 _tProbe Response in the Receiving Mode _g61 -- _g3.1.2 _tMonostatic Reflection Factor _g63 -- _g3.1.3 _tMonostatic Impedance and Admittance Changes _g64 -- _g3.1.4 _tReflection from a Matched Probe _g64 -- _g3.1.5 _tReflection Factor in the Unmodulated Situation _g65 -- _g3.1.6 _tReflection Factor with Mechanical Modulation _g65 -- _g3.1.7 _tReflection Factor with Electrical Modulation _g65 -- _g3.1.8 _tBistatic Transmission Factor _g67 -- _g3.1.9 _tIntroduction of a Generalized Term _g68 -- _g3.2 _tCalculation Of The Probe Response _g68 -- _g3.2.1 _tReciprocity Theorem _g68 -- _g3.2.2- _tReciprocity Formulation _g71 -- _g3.2.3 _tConjugate Matched Probe in the Monostatic Case _g73 -- _g3.2.4 _tReflectionless Matched Probe in the Monostatic Case _g73 -- _g3.2.5 _tModulated Probe in the Monostatic Case _g74 -- _g3.2.6 _tModulated Probe in the Bistatic Case _g75 -- _g3.3 _tFree-Space Measurements _g76 -- _g3.3.1 _tLocally Plane Waves _g76 -- _g3.3.2 _tAbsorption Cross Sections _g77 -- _g3.3.3 _tRCS for Monostatic Setups _g78 -- _g3.3.4 _tActive or Passive Transponder _g79 -- _g3.3.5 _tRCS for Bistatic Setups _g79 -- _g3.4 _tProbes Used For Near-Field Testing _g80 -- _g3.4.1 _tMain Kinds of Probes _g80 -- _g3.4.2 _tSmall Probes _g81 -- _g3.4.3 _tShort Electric Dipoles _g81 -- _g3.4.4 _tSmall Magnetic Loops _g84 -- _g3.4.5 _tTuned Probes _g86 -- _g3.4.6 _tSmall Reflecting Spheres _g87 -- _gChapter 4 _tMoving Probe Setups -- _g4.1 _tLow Invasiveness _g91 -- _g4.1.1 _tBasic Probe Requirements _g91 -- _g4.1.2 _tWhy a Monostatic Rather Than a Bistatic Configuration? _g92 -- _g4.1.3 _tDescription of a Measurement Configuration _g92 -- _g4.1.4 _tOptical Modulation _g93 -- _g4.1.5 _tLow-Frequency Connections with Resistive Wires _g94 -- _g4.1.6 _tCoherent Detection _g94 -- _g4.1.7 _tNumber of Measurement Points _g95 -- _g4.1.8 _tAbout the Measurement Time _g95 -- _g4.2 _tProbes For Field Measurements _g96 -- _g4.2.1 _tProbes for Direct Antenna Measurements _g96 -- _g4.2.2 _tProbes for EMC Measurements _g97 -- _g4.2.3 _tProbes for Dosimetry _g97 -- _g4.2.4 _tComponents of Modulated Scatterer Probes _g98 -- _g4.2.5 _tProbe for the Transverse Electric Field _g98 -- _g4.2.6 _tProbe for the Normal Electric Field _g99 -- _g4.2.7 _tProbe for the Transverse Magnetic Field _g100 -- _g4.2.8 _tOptically Modulated Probes _g100 -- _g4.3 _tReceivers For MST Arrangements _g101 -- _g4.3.1 _tHomodyne Receiver _g101 -- _g4.3.2 _tRemark About the Homodyne Receiver's Design _g102 -- _g4.3.3 _tMathematical Background _g102 -- _g4.3.4 _tCancellation of Unmodulated Signals _g103 -- _g4.3.5 _tSelection of the Modulation Frequency _g104 -- _g4.3.6 _tSignal-to-Noise Ratio _g105 -- _g4.4 _tAbout Measurement Accuracy _g106 -- _g4.4.1 _tSpatial Resolution _g106 -- _g4.4.2 _tSpurious Signals _g108 -- _g4.4.3 _tClose Range Interaction _g108 -- _g4.4.4 _tClose Range Interaction with Dielectric _g110 -- _g4.4.5 _tComparison with Simulations _g111 -- _g4.4.6 _tDynamic Range _g112 -- _g4.4.7 _tCaution: High Accuracy Is Not Always Required! _g113 -- _g4.4.8 _tScaled Models and the Similitude Theorem _g114 -- _g4.5 _tField Measurements In Materials _g115 -- _g4.5.1 _tImpact of Probe Immersion on Measurement Sensitivity _g115 -- _g4.5.2 _tTotal-Field Measurement with Modulated Probes _g116 -- _g4.5.3 _tTotal-Field Measurement with Unmodulated Probes _g116 -- _g4.6 _tOptical Analogy With Near-Field Microscopy _g117 -- _g4.6.1 _tScanning Near-Field Optical Microscopy _g117 -- _g4.6.2 _tMicrowave Near-Field Microscopy _g118 -- _gChapter 5 _tApplications of Single Probes -- _g5.1 _tDescription Of Some MST Test Setups _g123 -- _g5.1.1 _tNational Physical Laboratory _g123 -- _g5.1.2 _tSwiss Ecole Polytechnique Federale of Lausanne _g125 -- _g5.1.3 _tUniversity of Michigan at Ann Arbor _g126 -- _g5.1.4 _tOther Laboratories _g127 -- _g5.2 _tAntenna Diagnostics _g128 -- _g5.2.1 _tHorn Antennas _g128 -- _g5.2.2 _tMicrostrip Patch Antennas _g130 -- _g5.2.3 _tPatch Antennas with Parasitic Elements _g131 -- _g5.2.4 _tPIFA Dual Band Antennas _g132 -- _g5.2.5 _tMultifrequency Multiband Antennas _g132 -- _g5.2.6 _tNear-Field Diffraction by Two Slits _g133 -- _g5.3 _tPrinted Transmission Lines And Circuits _g135 -- _g5.3.1 _tWilkinson Power Dividers _g135 -- _g5.3.2 _tBranch Line Hybrid Couplers _g135 -- _g5.3.3 _tRat Race Hybrid Rings _g136 -- _g5.3.4 _tMeander Transmission Lines _g136 -- _g5.3.5 _tMicrostrip Filters with Holes in the Ground Plane _g138 -- _g5.3.6 _tMMICs _g141 -- _g5.3.7 _tRadiating Probe for Microstrip Integrated Amplifier _g141 -- _g5.3.8 _tCurrents on a Whisker Mixer for Radiometry _g142 -- _g5.4 _tGuiding Structures _g144 -- _g5.4.1 _tDetection of Electric-Field Lines in a Liquid Microstrip _g144 -- _g5.4.2 _tFields in a Rectangular Waveguide _g146 -- _g5.5 _tEMC _g147 -- _g5.6 _tIndustrial8 Applications _g148 -- _g5.6.1 _tMicrowave and RF Heating _g148 -- _g5.6.2 _tIndustrial Microwave and RF Heating _g148 -- _g5.6.3 _tModulated Scatterer Moisture Sensors _g149 -- _g5.6.4 _tNear-Field Measurement in High-Power Systems _g149 -- _g5.7 _tMedical Applications And Dosimetry _g152 -- _g5.7.1 _tDiathermy and Hyperthermia _g152 -- _g5.7.2 _tPortable Phones _g152 -- _g5.7.3 _tMeasurement of the SAR _g153 -- _g5.7.4 _tRadiometric Measurements _g154 -- _g5.7.5 _tSAR Measurement of Portable Phones _g155 -- _g5.7.6 _tHyperthermia Applicator and Probe Characterization _g157 -- _gChapter 6 _tProbe Arrays -- _g6.1.1 _tReduction of the Duration of Measurements _g161 -- _g6.1.2 _tReduction of the Amount of Measured Data _g162 -- _g6.1.3 _tSpeeding Up the Measurement Rate _g162 -- _g6.1.4 _tMeasurement Strategies _g163 -- _g6.2 _tSpecific Features Of Probe Arrays _g164 -- _g6.2.1 _tChoice of Architectures _g164 -- _g6.2.2 _tPreconceptions _g166 -- _g6.2.3 _tProbe Array Arrangements _g167 -- _g6.2.4 _tSpatial Sampling Requirements _g169 -- _g6.3 _tMST For Arrays _g170 -- _g6.3.1 _tArray Elements _g170 -- _g6.3.2 _tSensitivity of Collector Arrangements _g171 -- _g6.3.3 _tUniformity of Collector Arrangements _g173 -- _g6.3.4 _tCalibrating the Probe Array and Collector Arrangements _g176 -- _g6.3.5 _tPractical Bistatic Realizations _g178 -- _g6.3.6 _tDifferent Modulation Possibilities _g180 -- _g6.3.7 _tDirect Determination of the Far-Field Pattern _g181 -- _g6.3.8 _tFocusing at an Arbitrary Finite Distance _g183 -- _gChapter 7 _tApplications of Probe Arrays -- _g7.1 _tCommunications And Radar Antenna Testing _g187 -- _g7.1.1 _tAntenna Testing Background _g187 -- _g7.1.2 _tNear-Field Versus Direct Measurement Techniques _g189 -- _g7.1.3 _tSelecting the Proper Near-Field Setup _g189 -- _g7.1.4 _tLinear Probe Arrays _g191 -- _g7.1.5 _tPlanar Probe Arrays _g195 -- _g7.1.6 _tCircular Probe Arrays _g197 -- _g7.1.7 _tDirect Probing of the Far-Field Pattern _g200 -- _g7.2 _tRCS Measurements _g202 -- _g7.2.1 _tAbout Radar Testing _g202 -- _g7.2.2 _tPractical Implementation _g203 -- _g7.3 _tEMC Testing _g205 |
||
650 | 0 | _aMicrowave measurements | |
650 | 0 |
_aElectromagnetic waves _xScattering |
|
650 | 0 | _aModulation (Electronics) | |
650 | 0 | _aRadio | |
650 | 0 | _aRadar | |
700 | 1 | _aGardiol, Fred E. | |
902 | _aN.Tolba | ||
942 |
_2ddc _cBK |
||
999 |
_c2182 _d2182 |