000 11091cam a22003614a 4500
003 BUC
005 20220404043542.0
008 200120s2001 maua g b 001 0 eng d
010 _a2001035918
020 _a1580531474
020 _a9781580531474
040 _aBADR UNIVERSITY IN CAIRO
_beng
_cBADR UNIVERSITY IN CAIRO
_erda
041 _aeng
050 0 0 _aTK7876
_b.B63 2001
082 0 4 _a621.3813
_221
_bBJE
100 1 _aBolomey, J. C.
_q(Jean-Charles)
245 1 0 _aEngineering applications of the modulated scatterer technique /
_cJean-Charles Bolomey, Fred E. Gardiol
260 _aBoston :
_bArtech House,
_c2001
300 _axxii, 255 pages :
_billustrations ;
_c24 cm
336 _a36
490 1 _aArtech House antennas and propagation library
504 _aIncludes bibliographical references and index.
505 _g1.1
_tWhere Near-Field Measurements Are Useful
_g1 --
_g1.1.1
_tInformation Provided by Near-Field Maps
_g1 --
_g1.1.2
_tNear-Field Diagnostics
_g2 --
_g1.1.3
_tMeasurements May Perturb the Near-Fields
_g2 --
_g1.1.4
_tModulated Scatterer Approach
_g2 --
_g1.1.5
_tBasic Requirement
_g3 --
_g1.1.6
_tNear-to-Far-Field Transformations
_g3 --
_g1.1.7
_tTwo Sets of Applications of Modulated Scatterers
_g3 --
_g1.2
_tNear-Field Basics
_g4 --
_g1.2.1
_tSome Definitions for Free-Space Radiation of Antennas
_g4 --
_g1.2.2
_tExtension to Small Antennas and Circuits
_g5 --
_g1.2.3
_tAbout the Near Field Within Inhomogeneous Structures
_g6 --
_g1.2.4
_tRemark
_g6 --
_g1.3
_tVarious Kinds of Measurements
_g7 --
_g1.3.1
_tStandard Circuit Measurements
_g7 --
_g1.3.2
_tStandard Antenna Measurements
_g7 --
_g1.3.3
_tDirect Near-Field Measurement
_g8 --
_g1.3.4
_tPerturbation Techniques for Indirect Measurements
_g9 --
_g1.3.5
_tCavity Perturbation
_g9 --
_g1.3.6
_tPerturbation Measurement of SAR in Phantoms
_g10 --
_g1.3.7
_tPerturbation by a Scatterer
_g10 --
_g1.3.8
_tMeasurement of the Far-Field Pattern of an Antenna
_g11 --
_g1.4
_tModulated Scatterer Technique
_g11 --
_g1.4.1
_tSpinning Dipole
_g11 --
_g1.4.2
_tElectrically Modulated Scatterer
_g11 --
_g1.4.3
_tHistorical Landmarks
_g12 --
_g1.4.4
_tComparison of Direct and Indirect Measurements
_g13 --
_g1.4.5
_tTagging Systems and Transponders
_g13 --
_g1.4.6
_tBiologically Modulated Scatterers
_g15 --
_g1.5
_tAbout Computer Simulation And Measurement
_g17 --
_g1.6
_tField Maps
_g18 --
_g1.6.1
_tMicrostrip Directional Coupler
_g18 --
_g1.6.2
_tPrinted Patch Antenna
_g20 --
_g1.6.3
_tMeasurements of Large Antennas
_g22 --
_g1.6.4
_tEMC
_g24 --
_g1.6.5
_tDosimetry
_g25 --
_g1.6.6
_tMicrowave Tomography
_g27 --
_gChapter 2
_tBasic Scatterer Electromagnetics --
_g2.1.1
_tEffects Produced by a Field on a Probe
_g35 --
_g2.1.2
_tProbe Characteristics in the Receiving Mode
_g36 --
_g2.1.3
_tProbe Characteristics in the Scattering Mode
_g36 --
_g2.1.4
_tBistatic Operation
_g37 --
_g2.1.5
_tMonostatic Operation
_g38 --
_g2.1.6
_tDefinition of the Nominal Environment
_g38 --
_g2.1.7
_tRadar Analogy
_g39 --
_g2.1.8
_tPower Considerations
_g40 --
_g2.1.9
_tComparison of Monostatic and Bistatic Operations
_g40 --
_g2.1.10
_tPractical Considerations
_g40 --
_g2.2
_tPrinciple Of Modulated Scattering
_g41 --
_g2.2.1
_tModulated Scatterers
_g41 --
_g2.2.2
_tMechanically Modulated Scatterers
_g42 --
_g2.2.3
_tElectrically Modulated Scatterers
_g43 --
_g2.2.4
_tOptically Modulated Scatterers
_g44 --
_g2.2.5
_tLight Beam on Photosensitive Material
_g45 --
_g2.2.6
_tComparison of the Modulation Schemes
_g46 --
_g2.2.7
_tProperties of the MST
_g46 --
_g2.3
_tEquivalent Multiport Representation
_g47 --
_g2.3.1
_tEquivalent Linear Black Box
_g47 --
_g2.3.2
_t"Good" and "Bad" Obstacles
_g48 --
_g2.3.3
_tMatrix Formulations
_g49 --
_g2.3.4
_tImpedance Matrix
_g49 --
_g2.3.5
_tAdmittance Matrix
_g50 --
_g2.3.6
_tRelationships Between [Z] and [Y] Matrices
_g50 --
_g2.4
_tScattering Matrix Formulation
_g51 --
_g2.4.1
_tComplex Normalized Waves
_g51 --
_g2.4.2
_tScattering Matrix of an N-Port Device
_g52 --
_g2.4.3
_tTranslation of the Reference Planes
_g52 --
_g2.4.4
_tRelationships Between Matrices
_g53 --
_g2.4.5
_tRemark
_g54 --
_g2.4.6
_tScattering Matrix for the Monostatic Setup (N = 2)
_g54 --
_g2.4.7
_tScattering Matrix for the Bistatic Setup (N = 3)
_g56 --
_g2.4.8
_tExtension to Configurations for Which N> 3
_g57 --
_g2.4.9
_tRemark About Matrix Formulations
_g58 --
_gChapter 3
_tModulated Scattering Probes --
_g3.1
_tProbe Response In Various Situations
_g61 --
_g3.1.1
_tProbe Response in the Receiving Mode
_g61 --
_g3.1.2
_tMonostatic Reflection Factor
_g63 --
_g3.1.3
_tMonostatic Impedance and Admittance Changes
_g64 --
_g3.1.4
_tReflection from a Matched Probe
_g64 --
_g3.1.5
_tReflection Factor in the Unmodulated Situation
_g65 --
_g3.1.6
_tReflection Factor with Mechanical Modulation
_g65 --
_g3.1.7
_tReflection Factor with Electrical Modulation
_g65 --
_g3.1.8
_tBistatic Transmission Factor
_g67 --
_g3.1.9
_tIntroduction of a Generalized Term
_g68 --
_g3.2
_tCalculation Of The Probe Response
_g68 --
_g3.2.1
_tReciprocity Theorem
_g68 --
_g3.2.2-
_tReciprocity Formulation
_g71 --
_g3.2.3
_tConjugate Matched Probe in the Monostatic Case
_g73 --
_g3.2.4
_tReflectionless Matched Probe in the Monostatic Case
_g73 --
_g3.2.5
_tModulated Probe in the Monostatic Case
_g74 --
_g3.2.6
_tModulated Probe in the Bistatic Case
_g75 --
_g3.3
_tFree-Space Measurements
_g76 --
_g3.3.1
_tLocally Plane Waves
_g76 --
_g3.3.2
_tAbsorption Cross Sections
_g77 --
_g3.3.3
_tRCS for Monostatic Setups
_g78 --
_g3.3.4
_tActive or Passive Transponder
_g79 --
_g3.3.5
_tRCS for Bistatic Setups
_g79 --
_g3.4
_tProbes Used For Near-Field Testing
_g80 --
_g3.4.1
_tMain Kinds of Probes
_g80 --
_g3.4.2
_tSmall Probes
_g81 --
_g3.4.3
_tShort Electric Dipoles
_g81 --
_g3.4.4
_tSmall Magnetic Loops
_g84 --
_g3.4.5
_tTuned Probes
_g86 --
_g3.4.6
_tSmall Reflecting Spheres
_g87 --
_gChapter 4
_tMoving Probe Setups --
_g4.1
_tLow Invasiveness
_g91 --
_g4.1.1
_tBasic Probe Requirements
_g91 --
_g4.1.2
_tWhy a Monostatic Rather Than a Bistatic Configuration?
_g92 --
_g4.1.3
_tDescription of a Measurement Configuration
_g92 --
_g4.1.4
_tOptical Modulation
_g93 --
_g4.1.5
_tLow-Frequency Connections with Resistive Wires
_g94 --
_g4.1.6
_tCoherent Detection
_g94 --
_g4.1.7
_tNumber of Measurement Points
_g95 --
_g4.1.8
_tAbout the Measurement Time
_g95 --
_g4.2
_tProbes For Field Measurements
_g96 --
_g4.2.1
_tProbes for Direct Antenna Measurements
_g96 --
_g4.2.2
_tProbes for EMC Measurements
_g97 --
_g4.2.3
_tProbes for Dosimetry
_g97 --
_g4.2.4
_tComponents of Modulated Scatterer Probes
_g98 --
_g4.2.5
_tProbe for the Transverse Electric Field
_g98 --
_g4.2.6
_tProbe for the Normal Electric Field
_g99 --
_g4.2.7
_tProbe for the Transverse Magnetic Field
_g100 --
_g4.2.8
_tOptically Modulated Probes
_g100 --
_g4.3
_tReceivers For MST Arrangements
_g101 --
_g4.3.1
_tHomodyne Receiver
_g101 --
_g4.3.2
_tRemark About the Homodyne Receiver's Design
_g102 --
_g4.3.3
_tMathematical Background
_g102 --
_g4.3.4
_tCancellation of Unmodulated Signals
_g103 --
_g4.3.5
_tSelection of the Modulation Frequency
_g104 --
_g4.3.6
_tSignal-to-Noise Ratio
_g105 --
_g4.4
_tAbout Measurement Accuracy
_g106 --
_g4.4.1
_tSpatial Resolution
_g106 --
_g4.4.2
_tSpurious Signals
_g108 --
_g4.4.3
_tClose Range Interaction
_g108 --
_g4.4.4
_tClose Range Interaction with Dielectric
_g110 --
_g4.4.5
_tComparison with Simulations
_g111 --
_g4.4.6
_tDynamic Range
_g112 --
_g4.4.7
_tCaution: High Accuracy Is Not Always Required!
_g113 --
_g4.4.8
_tScaled Models and the Similitude Theorem
_g114 --
_g4.5
_tField Measurements In Materials
_g115 --
_g4.5.1
_tImpact of Probe Immersion on Measurement Sensitivity
_g115 --
_g4.5.2
_tTotal-Field Measurement with Modulated Probes
_g116 --
_g4.5.3
_tTotal-Field Measurement with Unmodulated Probes
_g116 --
_g4.6
_tOptical Analogy With Near-Field Microscopy
_g117 --
_g4.6.1
_tScanning Near-Field Optical Microscopy
_g117 --
_g4.6.2
_tMicrowave Near-Field Microscopy
_g118 --
_gChapter 5
_tApplications of Single Probes --
_g5.1
_tDescription Of Some MST Test Setups
_g123 --
_g5.1.1
_tNational Physical Laboratory
_g123 --
_g5.1.2
_tSwiss Ecole Polytechnique Federale of Lausanne
_g125 --
_g5.1.3
_tUniversity of Michigan at Ann Arbor
_g126 --
_g5.1.4
_tOther Laboratories
_g127 --
_g5.2
_tAntenna Diagnostics
_g128 --
_g5.2.1
_tHorn Antennas
_g128 --
_g5.2.2
_tMicrostrip Patch Antennas
_g130 --
_g5.2.3
_tPatch Antennas with Parasitic Elements
_g131 --
_g5.2.4
_tPIFA Dual Band Antennas
_g132 --
_g5.2.5
_tMultifrequency Multiband Antennas
_g132 --
_g5.2.6
_tNear-Field Diffraction by Two Slits
_g133 --
_g5.3
_tPrinted Transmission Lines And Circuits
_g135 --
_g5.3.1
_tWilkinson Power Dividers
_g135 --
_g5.3.2
_tBranch Line Hybrid Couplers
_g135 --
_g5.3.3
_tRat Race Hybrid Rings
_g136 --
_g5.3.4
_tMeander Transmission Lines
_g136 --
_g5.3.5
_tMicrostrip Filters with Holes in the Ground Plane
_g138 --
_g5.3.6
_tMMICs
_g141 --
_g5.3.7
_tRadiating Probe for Microstrip Integrated Amplifier
_g141 --
_g5.3.8
_tCurrents on a Whisker Mixer for Radiometry
_g142 --
_g5.4
_tGuiding Structures
_g144 --
_g5.4.1
_tDetection of Electric-Field Lines in a Liquid Microstrip
_g144 --
_g5.4.2
_tFields in a Rectangular Waveguide
_g146 --
_g5.5
_tEMC
_g147 --
_g5.6
_tIndustrial8 Applications
_g148 --
_g5.6.1
_tMicrowave and RF Heating
_g148 --
_g5.6.2
_tIndustrial Microwave and RF Heating
_g148 --
_g5.6.3
_tModulated Scatterer Moisture Sensors
_g149 --
_g5.6.4
_tNear-Field Measurement in High-Power Systems
_g149 --
_g5.7
_tMedical Applications And Dosimetry
_g152 --
_g5.7.1
_tDiathermy and Hyperthermia
_g152 --
_g5.7.2
_tPortable Phones
_g152 --
_g5.7.3
_tMeasurement of the SAR
_g153 --
_g5.7.4
_tRadiometric Measurements
_g154 --
_g5.7.5
_tSAR Measurement of Portable Phones
_g155 --
_g5.7.6
_tHyperthermia Applicator and Probe Characterization
_g157 --
_gChapter 6
_tProbe Arrays --
_g6.1.1
_tReduction of the Duration of Measurements
_g161 --
_g6.1.2
_tReduction of the Amount of Measured Data
_g162 --
_g6.1.3
_tSpeeding Up the Measurement Rate
_g162 --
_g6.1.4
_tMeasurement Strategies
_g163 --
_g6.2
_tSpecific Features Of Probe Arrays
_g164 --
_g6.2.1
_tChoice of Architectures
_g164 --
_g6.2.2
_tPreconceptions
_g166 --
_g6.2.3
_tProbe Array Arrangements
_g167 --
_g6.2.4
_tSpatial Sampling Requirements
_g169 --
_g6.3
_tMST For Arrays
_g170 --
_g6.3.1
_tArray Elements
_g170 --
_g6.3.2
_tSensitivity of Collector Arrangements
_g171 --
_g6.3.3
_tUniformity of Collector Arrangements
_g173 --
_g6.3.4
_tCalibrating the Probe Array and Collector Arrangements
_g176 --
_g6.3.5
_tPractical Bistatic Realizations
_g178 --
_g6.3.6
_tDifferent Modulation Possibilities
_g180 --
_g6.3.7
_tDirect Determination of the Far-Field Pattern
_g181 --
_g6.3.8
_tFocusing at an Arbitrary Finite Distance
_g183 --
_gChapter 7
_tApplications of Probe Arrays --
_g7.1
_tCommunications And Radar Antenna Testing
_g187 --
_g7.1.1
_tAntenna Testing Background
_g187 --
_g7.1.2
_tNear-Field Versus Direct Measurement Techniques
_g189 --
_g7.1.3
_tSelecting the Proper Near-Field Setup
_g189 --
_g7.1.4
_tLinear Probe Arrays
_g191 --
_g7.1.5
_tPlanar Probe Arrays
_g195 --
_g7.1.6
_tCircular Probe Arrays
_g197 --
_g7.1.7
_tDirect Probing of the Far-Field Pattern
_g200 --
_g7.2
_tRCS Measurements
_g202 --
_g7.2.1
_tAbout Radar Testing
_g202 --
_g7.2.2
_tPractical Implementation
_g203 --
_g7.3
_tEMC Testing
_g205
650 0 _aMicrowave measurements
650 0 _aElectromagnetic waves
_xScattering
650 0 _aModulation (Electronics)
650 0 _aRadio
650 0 _aRadar
700 1 _aGardiol, Fred E.
902 _aN.Tolba
942 _2ddc
_cBK
999 _c2182
_d2182