Optical methods of measurement : wholefield techniques / Rajpal S. Sirohi.
Material type:
TextLanguage: English Series: Publication details: Boca Raton : CRC Press, c2009Edition: 2nd edDescription: xxvi, 290 p. : ill. ; 25 cmISBN: 1574446975 (hardcover : alk. paper); 9781574446975Subject(s): Optical measurementsDDC classification: 681.25 LOC classification: QC367 | .S57 2009
Contents:
Waves and beams -- Optical interference -- Diffraction -- Phase-evaluation methods -- Detectors and recording materials -- Holographic interferometry -- Speckle metrology -- Photoelasticity -- The Moiré phenomenon.
| Item type | Current library | Home library | Call number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
Books
|
School of Engineering and Technology | School of Engineering and Technology | 681.25 SRO (Browse shelf (Opens below)) | Available | 2483 |
Total holds: 0
Includes bibliographical references and index.
Waves and beams -- Optical interference -- Diffraction -- Phase-evaluation methods -- Detectors and recording materials -- Holographic interferometry -- Speckle metrology -- Photoelasticity -- The Moiré phenomenon.
There are no comments on this title.